Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423803 | Predicting tool induced shift using Moiré overlay targets | Yatir Linden, Nadav Gutman, Mark Ghinovker | 2025-09-23 |
| 11783466 | Machine learning for metrology measurements | Yehuda Odes, Udi Shusterman | 2023-10-10 |
| 11410290 | Machine learning for metrology measurements | Yehuda Odes, Udi Shusterman | 2022-08-09 |
| 9999402 | Automatic image segmentation | Dan Shmuel Chevion, Pavel Kisilev, Eugene Walach | 2018-06-19 |
| 8249399 | Optical character recognition verification | Ella Barkan, Dan Shmuel Chevion, Doron Tal | 2012-08-21 |