Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7768637 | Method for acquiring high-resolution images of defects on the upper surface of the wafer edge | Thin Van Luu | 2010-08-03 |
| 7623698 | Method of learning a knowledge-based database used in automatic defect classification | Dirk G. Soenksen, Ralf Friedrich, Andreas Draeger, Thin Van Luu, Wolfgang Langer | 2009-11-24 |