Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12254247 | Inspection result analysis device, inspection result analysis method, and storage medium | Yasushi Arimura, Mizuka Nishio | 2025-03-18 |
YY
Yukio Yoshinaga
Overall (All Time): #2,397,763 of 4,157,543Top 60%
1
Patents All Time