Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8193819 | Method and apparatus for improving yield ratio of testing | Wei Wang | 2012-06-05 |
| 8085059 | RF chip test method | Hsiu-Ju Chen | 2011-12-27 |
| 7834775 | Automatic detecting device for radio frequency environment | Chen-Yang Hsieh | 2010-11-16 |
| 7688093 | Sharing conversion board for testing chips | Chen-Yang Hsieh | 2010-03-30 |