Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11674997 | Current supply device and test system including the same | Ken Yawata | 2023-06-13 |
| 11619666 | Source measure apparatus including feedback path and measurement path | Nobuaki Iwaki, Yasuhiro Miyake, Masaki Sato | 2023-04-04 |
| 11333701 | Current supply device and test system including the same | Ken Yawata | 2022-05-17 |
| 9651596 | System and apparatus for measuring capacitance | Kenichi Takano | 2017-05-16 |
| 7812619 | Capacitance measuring apparatus and capacitance measuring method | Shinichi Tanida, Tomoe Ikawa | 2010-10-12 |
| 5285151 | Method and apparatus for measuring the breakdown voltage of semiconductor devices | Hideo Akama | 1994-02-08 |