HM

Hajime Matsuda

KE Keyence: 14 patents #3 of 266Top 2%
SI Sumitomo Electric Device Innovations: 9 patents #9 of 208Top 5%
FL Fujitsu Quantum Devices Limited: 7 patents #8 of 110Top 8%
ED Eudyna Devices: 4 patents #8 of 80Top 10%
SL Shiseido Company, Limited: 3 patents #241 of 1,112Top 25%
QL Qp Holdings Limited: 1 patents #18 of 76Top 25%
SC Senju Pharmaceutical Co.: 1 patents #120 of 231Top 55%
NE Nec: 1 patents #7,889 of 14,502Top 55%
Overall (All Time): #79,384 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 25 most recent of 40 patents

Patent #TitleCo-InventorsDate
11209712 Image processing apparatus 2021-12-28
10896970 Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same Tadashi Watanabe 2021-01-19
10840091 Process of forming epitaxial substrate and semiconductor device provided on the same 2020-11-17
10734510 Semiconductor device 2020-08-04
10686053 Process of forming high electron mobility transistor (HEMT) and HEMT formed by the same Tadashi Watanabe 2020-06-16
10627216 Image processing apparatus Masashi Nakao 2020-04-21
10546746 Process of forming semiconductor epitaxial substrate 2020-01-28
10541322 Semiconductor device 2020-01-21
10241056 Inspection apparatus, inspection method, and program 2019-03-26
10156525 Inspection apparatus, inspection method, and program 2018-12-18
10147605 Process of producing epitaxial substrate Tadashi Watanabe 2018-12-04
10056252 Process of forming nitride semiconductor layers Tadashi Watanabe 2018-08-21
10036713 Inspection apparatus, inspection method, and program 2018-07-31
9778203 Inspection apparatus, inspection method, and program 2017-10-03
9689806 Inspection apparatus, inspection method, and program 2017-06-27
9673094 Semiconductor device having via hole coated in side surfaces with heat treated nitride metal and method to form the same Tadashi Watanabe 2017-06-06
9494528 Inspection apparatus, inspection method, and program 2016-11-15
9033244 External illumination apparatus for optical information reading apparatus Tomomi Izaki, Daisuke Matsumoto 2015-05-19
8890917 Printing quality evaluation system, laser marking apparatus, printing condition setting device, printing quality evaluation apparatus, printing condition setting program, printing quality evaluation program, and computer-readable recording medium Takaaki Ito 2014-11-18
8714455 External illumination apparatus for optical information reading apparatus Tomomi Izaki, Daisuke Matsumoto 2014-05-06
8479991 Illumination setting support apparatus of optical information reading apparatus Shigeo Nakamura 2013-07-09
8342404 Illumination setting support apparatus of optical information reading apparatus Shigeo Nakamura 2013-01-01
8188520 Field effect transistor and method for fabricating the same Tadashi Watanabe 2012-05-29
8172143 Code reading device Shigeo Nakamura 2012-05-08
7964486 Field effect transistor and method for fabricating the same Tadashi Watanabe 2011-06-21