EW

Etienne Waelkens

KL Katholieke Universiteit Leuven: 2 patents #105 of 754Top 15%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #173 of 512Top 35%
VU Vanderbilt University: 1 patents #725 of 1,609Top 50%
📍 Rotselaar, BE: #11 of 47 inventorsTop 25%
Overall (All Time): #1,401,997 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11790629 Intensity normalization in imaging mass spectrometry Bart De Moor, Raf Van De Plas 2023-10-17
10540536 System for interpretation of image patterns in terms of anatomical or curated patterns Richard Caprioli, Bart De Moor, Raf Van De Plas, Nico Verbeeck 2020-01-21
10268916 Intensity normalization in imaging mass spectrometry Bart De Moor, Raf Van De Plas 2019-04-23