Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4695797 | Method of and apparatus for layer thickness measurement | Volker Deutsch | 1987-09-22 |
| 4658648 | Method of and apparatus for the ultrasonic measurement of the thickness of test articles | Heinz Schafer | 1987-04-21 |