Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5627645 | Method of and apparatus for measuring retardation of composite layer | Shinichi Nagata, Kiyokazu Sakai | 1997-05-06 |
| 5504581 | Method and apparatus for measuring birefringence | Shinichi Nagata, Kiyokazu Sakai, Osamu Tomita | 1996-04-02 |