Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8649591 | Pattern inspection apparatus and pattern inspection method | Makoto Kaneko, Takayoshi Fujii, Yusaku Konno, Mitsutoshi WATABIKI, Shinichi Imai +1 more | 2014-02-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8649591 | Pattern inspection apparatus and pattern inspection method | Makoto Kaneko, Takayoshi Fujii, Yusaku Konno, Mitsutoshi WATABIKI, Shinichi Imai +1 more | 2014-02-11 |