Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12235770 | Failure analysis system of semiconductor device, failure analysis method of semiconductor device, and non-transitory computer readable medium | Mami Kodama, Masahiro Noguchi, Yumiko Watanabe | 2025-02-25 |
| 9128143 | Semiconductor device failure analysis system and semiconductor memory device | Mami Kodama | 2015-09-08 |
| 8479063 | Failure analyzing device and failure analyzing method | — | 2013-07-02 |
| 8316264 | Failure analysis method, failure analysis apparatus, and computer program product | — | 2012-11-20 |
| 7716549 | Semiconductor apparatus and testing method | — | 2010-05-11 |
| 7238958 | Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor device | — | 2007-07-03 |