Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6601203 | Test program generation system and test program generation method for semiconductor test apparatus | Yoshihiro Asano, Koji Komuro, Kinji Okabe | 2003-07-29 |
| 5831997 | Pattern generating apparatus | — | 1998-11-03 |