Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12362264 | Semiconductor device | Toru Sugiyama, Akira Yoshioka, Hung Hung, Hitoshi Kobayashi | 2025-07-15 |
| 12328924 | Semiconductor device | Hung Hung, Akira Yoshioka, Toru Sugiyama, Masaaki Onomura | 2025-06-10 |
| 12273101 | Semiconductor device | Toru Sugiyama, Noriaki Yoshikawa, Yasuhiko Kuriyama, Akira Yoshioka, Hitoshi Kobayashi +4 more | 2025-04-08 |
| 12170316 | Nitride semiconductor device with element isolation area | Akira Yoshioka, Hung Hung, Hitoshi Kobayashi, Tetsuya Ohno, Toru Sugiyama | 2024-12-17 |
| 12062651 | Semiconductor device | Hung Hung, Akira Yoshioka, Toru Sugiyama, Hitoshi Kobayashi, Tetsuya Ohno +3 more | 2024-08-13 |
| 12046668 | Semiconductor device | Toru Sugiyama, Akira Yoshioka, Hitoshi Kobayashi, Masaaki Onomura, Hung Hung +2 more | 2024-07-23 |
| 12027614 | Semiconductor device | Hitoshi Kobayashi, Hung Hung | 2024-07-02 |
| 12002858 | Semiconductor device | Tetsuya Ohno, Akira Yoshioka, Toru Sugiyama, Hung Hung, Hitoshi Kobayashi | 2024-06-04 |
| 11984387 | Plurality of stacked transistors attached by solder balls | Toru Sugiyama, Akira Yoshioka | 2024-05-14 |
| 11948864 | Semiconductor device | Akira Yoshioka, Hung Hung, Toru Sugiyama, Hitoshi Kobayashi | 2024-04-02 |
| 11830916 | Nitride semiconductor device with element isolation area | Akira Yoshioka, Hung Hung, Hitoshi Kobayashi, Tetsuya Ohno, Toru Sugiyama | 2023-11-28 |
| 11508647 | Semiconductor device | Toru Sugiyama, Akira Yoshioka, Hung Hung, Hitoshi Kobayashi, Tetsuya Ohno +3 more | 2022-11-22 |
| 11448535 | Flow rate calculation system, flow rate calculation system program, flow rate calculation method, and flow rate calculation device | Masanori Terasaka, Koji Imamura, Osamu Horinouchi | 2022-09-20 |
| 11290100 | Semiconductor device | Hung Hung, Akira Yoshioka, Toru Sugiyama, Masaaki Iwai, Naonori Hosokawa +3 more | 2022-03-29 |
| 11264899 | Semiconductor device | Akira Yoshioka, Toru Sugiyama, Masaaki Iwai, Naonori Hosokawa, Masaaki Onomura +1 more | 2022-03-01 |
| 11251298 | Power semiconductor device | Hung Hung, Masaaki Onomura | 2022-02-15 |
| 11162883 | Fluid characteristics measurement system, program storage medium storing program for fluid characteristics measurement system, and fluid characteristics measurement method | — | 2021-11-02 |
| 10998433 | Semiconductor device | Hung Hung, Akira Yoshioka, Toru Sugiyama, Masaaki Iwai, Naonori Hosokawa +1 more | 2021-05-04 |
| 10771057 | Semiconductor device | Akira Yoshioka, Toru Sugiyama, Masaaki Iwai, Naonori Hosokawa, Masaaki Onomura +1 more | 2020-09-08 |
| 10074739 | Semiconductor device having electric field near drain electrode alleviated | Akira Yoshioka, Kohei Oasa, Hung Hung | 2018-09-11 |
| 9887281 | Semiconductor device | Hung Hung, Akira Yoshioka | 2018-02-06 |
| 9627489 | Semiconductor device | Hung Hung, Kohei Oasa, Akira Yoshioka | 2017-04-18 |
| 9627504 | Semiconductor device | Kohei Oasa, Akira Yoshioka | 2017-04-18 |
| 9543146 | Manufacturing method of semiconductor device that includes forming plural nitride semiconductor layers of identical material | Naoharu Sugiyama, Hung Hung, Akira Yoshioka | 2017-01-10 |
| 9484429 | High electron mobility transistor (HEMT) capable of absorbing a stored hole more efficiently and method for manufacturing the same | Mayumi Morizuka | 2016-11-01 |