Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5617428 | Scan test circuit and semiconductor integrated circuit device with scan test circuit | — | 1997-04-01 |
| 4876637 | Power converter and method of controlling the same | Tadao Mose, Tatuhisa Kitasin | 1989-10-24 |