Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12019434 | Manufacturing condition output apparatus, quality management system, and storage medium | Toru Ito, Shintarou Takahashi, Rumi Hayakawa | 2024-06-25 |
| 11520672 | Anomaly detection device, anomaly detection method and storage medium | — | 2022-12-06 |
| 10909419 | Abnormality detection device, learning device, abnormality detection method, and learning method | Hidemasa ITOU, Takashi Morimoto, Shintarou Takahashi | 2021-02-02 |