Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE41016 | Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits | — | 2009-12-01 |
| 7549097 | Semiconductor integrated circuit device and method of testing the same | — | 2009-06-16 |
| RE40105 | Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits | — | 2008-02-26 |
| 7208759 | Semiconductor integrated circuit device and method of testing the same | — | 2007-04-24 |
| 7002232 | Semiconductor integrated circuit device and method of testing the same | — | 2006-02-21 |
| 6750527 | Semiconductor integrated circuit device having a plurality of wells, test method of testing the semiconductor integrated circuit device, and test device which executes the test method | — | 2004-06-15 |
| 6518073 | Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices | — | 2003-02-11 |
| 6335209 | Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory | — | 2002-01-01 |
| 6094733 | Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices | — | 2000-07-25 |
| 6055655 | Semiconductor integrated circuit device and method of testing the same | — | 2000-04-25 |
| 5923600 | Semiconductor device and test method and apparatus for semiconductor device | — | 1999-07-13 |
| 5825783 | Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip and method of testing the device | — | 1998-10-20 |
| 5818249 | Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits | — | 1998-10-06 |
| 5525912 | Probing equipment and a probing method | — | 1996-06-11 |