Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9157896 | Ultrasonic flaw detecting apparatus and ultrasonic flaw detecting method | Yoshino Ito, Hirokazu Karasawa, Yoshio Ueda, Tsuyoshi Hieda, Tetsuo KAWAKAMI +4 more | 2015-10-13 |
| 8977580 | Defect classification apparatus | Kazunori Anayama, Toshiyuki Suzuma, Eiji Honda, Takahiro Okada, Shinya Yoshikawa +1 more | 2015-03-10 |