Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10317367 | Eddy-current flaw detector and eddy-current flaw detection method | Noriyasu Kobayashi, Souichi Ueno, Naotaka Suganuma, Takeshi Maehara, Takashi Kasuya +1 more | 2019-06-11 |
| 9214024 | Three-dimensional distance measurement apparatus and method therefor | Tetsuro Aikawa, Yoshinori Satoh, Makoto Ochiai, Yasuhiro Yuguchi | 2015-12-15 |
| 8976242 | Visual inspection apparatus and visual inspection method | Tetsuro Aikawa, Yoshinori Satoh, Makoto Ochiai, Hiroyuki Adachi, Yasuhiro Yuguchi +1 more | 2015-03-10 |
| 8483444 | Apparatus for inspecting and measuring object to be measured | Tetsuro Aikawa, Yoshinori Satoh, Naruhiko Mukai, Hisashi Hozumi, Yasuhiro Yuguchi | 2013-07-09 |