Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5969531 | Inspection apparatus for inspecting performance of structure by inserting measuring element through gap formed therein | Shin Murakami, Tadashi Munakata, Norihito Togashi, Satoshi Suzuki, Sueyoshi Mizuno +5 more | 1999-10-19 |