Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10718789 | Common test board, IP evaluation board, and semiconductor device test method | Seiji Sakurai | 2020-07-21 |
| 10101359 | Common test board, IP evaluation board, and semiconductor device test method | Seiji Sakurai | 2018-10-16 |
| 7439137 | Method for manufacturing semiconductor device | Hiroyasu Ishida, Hirotoshi Kubo, Shouji Miyahara | 2008-10-21 |