Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7188288 | Semiconductor LSI circuit with scan circuit, scan circuit system, scanning test system and method | — | 2007-03-06 |
| 7139952 | Semiconductor integrated circuit detecting glitch noise and test method of the same | Takashi Matsumoto | 2006-11-21 |