Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6530046 | Circuit, semiconductor device and method for enhancing test efficiency of function modules | Eiji Hasegawa, Yoshikatu Hatagaki, Ayumi Ishii, Hidekazu Saito | 2003-03-04 |