Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5179433 | Breakdown evaluating test element | Hisanori Misawa | 1993-01-12 |
| 5144147 | Ion implantation apparatus and method of cleaning the same | Katsuya Okumura | 1992-09-01 |
| 4682204 | Fuse element for integrated circuit memory device | Hidetaro Nishimura | 1987-07-21 |
| 4532401 | Apparatus and method for cutting a wiring pattern | Hidetaro Nishimura | 1985-07-30 |