MT

Makiko Tamaoki

KT Kabushiki Kaisha Toshiba: 3 patents #8,011 of 21,451Top 40%
Overall (All Time): #1,620,818 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6190520 Impurity measuring device Yumi Sasaki 2001-02-20
5882504 Method of measuring impurities Yumi Sasaki 1999-03-16
5426057 Method of measuring amount of organic material adsorbed to surface of semiconductor substrate 1995-06-20