Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6429454 | Semiconductor device with test circuit | Nobuaki Otsuka, Osamu Hirabayashi, Yasushi Kameda | 2002-08-06 |
| 6408414 | Semiconductor device provided with a boundary-scan test circuit | — | 2002-06-18 |
| 5111271 | Semiconductor device using standard cell system | Shojiro Mori | 1992-05-05 |