Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8406368 | Burn-up profile measuring method, burn-up profile measuring apparatus, radiation signal distribution measuring apparatus, and burn-up profile measuring program | Naotaka Oda, Yutaka Tokiwa, Makoto Ueda | 2013-03-26 |
| 8401141 | Axial void fraction distribution measurement method and neutron multiplication factor evaluating method | Makoto Ueda, Ishi Mitsuhashi, Tsukasa Kikuchi, Kenichi Yoshioka, Tomoharu Sasaki +1 more | 2013-03-19 |