Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5396185 | System and carrier for testing semiconductor integrated circuit devices | Ryoji Honma, Soichi Kawasaki, Hiroyuki Ohira, Kouichi Watanabe | 1995-03-07 |
| 5237268 | Film carrier structure capable of simplifying test | Ryoji Honma, Soichi Kawasaki, Hiroyuki Ohira, Kouichi Watanabe | 1993-08-17 |