CI

Chie Iwasa

KT Kabushiki Kaisha Toshiba: 2 patents #9,982 of 21,451Top 50%
Overall (All Time): #2,152,244 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7464296 System and method for identifying failure candidates in a semiconductor apparatus 2008-12-09
6810344 Semiconductor testing method and semiconductor testing apparatus for semiconductor devices, and program for executing semiconductor testing method 2004-10-26