Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8680880 | Method and apparatus for testing integrated circuit | Hidehiro Kiyofuji, Tetsuya Iwabuchi, Toshiyuki Kudo | 2014-03-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8680880 | Method and apparatus for testing integrated circuit | Hidehiro Kiyofuji, Tetsuya Iwabuchi, Toshiyuki Kudo | 2014-03-25 |