Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10559471 | Method of manufacturing bonded wafer | — | 2020-02-11 |
| 10151006 | Method of detecting abnormality at blast furnace and method of operating blast furnace | Naoshi Yamahira, Toshifumi Kodama, Yusuke Tanaka | 2018-12-11 |