Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12106466 | Photographing condition determining method for metal structure, photographing method for metal structure, phase classification method for metal structure, photographing condition determining device for metal structure, photographing device for metal structure, phase classification device for metal structure, material property estimating method for metal material, and material property estimating device for metal material | Yoshie Obata, Shin Ishikawa, Takako Yamashita, Takeshi Nishiyama | 2024-10-01 |