Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11403747 | Fine ratio measuring device and fine ratio measuring system | Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Toshiki Tsuboi | 2022-08-02 |
| 11391662 | Raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus | Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Toshiki Tsuboi | 2022-07-19 |
| 9799110 | Abnormality detection method and blast furnace operation method | Takehide Hirata, Naoshi Yamahira, Hidekazu Abe | 2017-10-24 |