Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5831265 | Scanning electron microscope | — | 1998-11-03 |
| 4553030 | Method for automatic analysis of electron beam diffraction pattern | Moriyasu Tokiwai, Sakumi Moriguchi | 1985-11-12 |