Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7553335 | Scanning probe microscope probe and manufacturing method therefor, scanning probe microscope and using method therefor, needle-like body and manufacturing method therefor, electronic device and manufacturing method therefor, charge density wave quantum phase microscope, and charge density wave quantum interferometer | Satoshi Tanda, Migaku Oda, Katsuhiko Inagaki, Hiroyuki Ohkawa, Takeshi Toshima +2 more | 2009-06-30 |