Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4918928 | Apparatus for testing IC devices at low temperature and cooling bag for use in testing IC devices at low temperature | Keizo Tokushige, Akeo Kimura, Takahiro Nihei | 1990-04-24 |