Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7947967 | Method for evaluating a semiconductor substrate | Hiroki Sugimoto | 2011-05-24 |
| 4492871 | Method for determining impurities in epitaxial silicon crystals | — | 1985-01-08 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7947967 | Method for evaluating a semiconductor substrate | Hiroki Sugimoto | 2011-05-24 |
| 4492871 | Method for determining impurities in epitaxial silicon crystals | — | 1985-01-08 |