SU

Steven Ulrich

IO Ionwerks: 12 patents #6 of 30Top 20%
NE Nexa3D: 1 patents #16 of 28Top 60%
Overall (All Time): #369,402 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12023865 Light engines for vat polymerization 3D printers Francisco Santos, Izhar Medalsy 2024-07-02
11391681 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters 2022-07-19
10876982 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters 2020-12-29
10446383 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters 2019-10-15
9297761 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters 2016-03-29
8829428 Time-of-flight spectrometry and spectroscopy of surfaces J. Albert Schultz, Thomas F. Egan, Kelley L. Waters 2014-09-09
8614416 Nonoparticulate assisted nanoscale molecular imaging by mass spectrometery J. Albert Schultz, Thomas F. Egan, Ernest K. Lewis, Kelley L. Waters 2013-12-24
8519329 Time-of-flight mass spectrometry of surfaces J. Albert Schultz, Thomas F. Egan, Kelley L. Waters 2013-08-27
8492710 Fast time-of-flight mass spectrometer with improved data acquisition system Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz +1 more 2013-07-23
8101909 Time-of-flight mass spectrometry of surfaces Thomas F. Egan, J. Albert Schultz, Kelley L. Waters 2012-01-24
7800054 Fast time-of-flight mass spectrometer with improved dynamic range Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz +1 more 2010-09-21
7365313 Fast time-of-flight mass spectrometer with improved data acquisition system Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz +1 more 2008-04-29
7084393 Fast time-of-flight mass spectrometer with improved data acquisition system Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, J. Albert Schultz +1 more 2006-08-01