JS

J. Albert Schultz

IO Ionwerks: 33 patents #1 of 30Top 4%
TS Texas A&M University System: 2 patents #346 of 1,706Top 25%
University of California: 1 patents #8,022 of 18,278Top 45%
UE US Dept of Energy: 1 patents #1,355 of 5,099Top 30%
📍 Houston, TX: #417 of 21,073 inventorsTop 2%
🗺 Texas: #3,051 of 125,132 inventorsTop 3%
Overall (All Time): #98,125 of 4,157,543Top 3%
35
Patents All Time

Issued Patents All Time

Showing 26–35 of 35 patents

Patent #TitleCo-InventorsDate
7145134 Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions Marc Gonin, Valeri Raznikov, Katrin Fuhrer, Michael I. McCully 2006-12-05
7084393 Fast time-of-flight mass spectrometer with improved data acquisition system Katrin Fuhrer, Marc Gonin, Thomas F. Egan, William Burton, Valerie E. Vaughn +1 more 2006-08-01
7084395 Time-of-flight mass spectrometer for monitoring of fast processes Katrin Fuhrer, Marc Gonin, Kent J. Gillig, Thomas F. Egan, Michael I. McCully 2006-08-01
7081617 Gas-phase purification of biomolecules by ion mobility for patterning microarrays and protein crystal growth John A. McLean, David H. Russell 2006-07-25
6992284 Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions Valeri Raznikov, Thomas F. Egan, Michael V. Ugarov, Agnes Tempez 2006-01-31
6989528 Gold implantation/deposition of biological samples for laser desorption three dimensional depth profiling of tissues Michael V. Ugarov, Thomas F. Egan, Agnes Tempez, Yvon Le Beyec, Serge Della-Negra 2006-01-24
6909090 Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions Marc Gonin, Valeri Raznikov, Katrin Fuhrer, Michael I. McCully 2005-06-21
6747271 Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition Marc Gonin, Valeri Raznikov, Katrin Fuhrer, Michael I. McCully 2004-06-08
6008491 Time-of-flight SIMS/MSRI reflectron mass analyzer and method Vincent S. Smentkowski, Dieter M. Gruen, Alan R. Krauss, John C. Holecek 1999-12-28
5087815 High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis Howard K. Schmidt 1992-02-11