Issued Patents All Time
Showing 26–41 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7687771 | High sensitivity mass spectrometer interface for multiple ion sources | Charles Jolliffe, Gholamreza Javahery, Ilia Tomski | 2010-03-30 |
| 7659505 | Ion source vessel and methods | Charles Jolliffe, Gholamreza Javahery, Serguei Savtchenko | 2010-02-09 |
| 7569811 | Concentrating mass spectrometer ion guide, spectrometer and method | Gholamreza Javahery, Charles Jolliffe, Ilia Tomski | 2009-08-04 |
| 7439498 | Method and apparatus for separation of isobaric interferences | Albert E. Litherland, Jonathan P. Doupe, William Edward Kieser, Xiao-Lei Zhao, Gholamreza Javahery +2 more | 2008-10-21 |
| 7405398 | Mass spectrometer interface | Charles Jolliffe, Gholamreza Javahery | 2008-07-29 |
| 7365317 | RF surfaces and RF ion guides | Craig M. Whitehouse, David G. Welkie | 2008-04-29 |
| 7091477 | Mass spectrometer interface | Charles Jolliffe, Gholamreza Javahery | 2006-08-15 |
| 7049584 | Fragmentation methods for mass spectrometry | Craig M. Whitehouse, David G. Welkie, Gholamreza Javahery, Sergey Rakov | 2006-05-23 |
| 7034292 | Mass spectrometry with segmented RF multiple ion guides in various pressure regions | Craig M. Whitehouse, David G. Welkie, Gholamreza Javahery | 2006-04-25 |
| 6992285 | Method and apparatus for analyzing a substance using MSn analysis | Bruce Thomson | 2006-01-31 |
| 6919562 | Fragmentation methods for mass spectrometry | Craig M. Whitehouse, David G. Welkie, Gholamreza Javahery, Sergey Rakov | 2005-07-19 |
| 6525312 | Mass spectrometer with method for real time removal of background signal | — | 2003-02-25 |
| 6114691 | RF-only mass spectrometer with auxiliary excitation | — | 2000-09-05 |
| 5565679 | Method and apparatus for plasma mass analysis with reduced space charge effects | Scott D. Tanner, Donald J. Douglas | 1996-10-15 |
| 5463219 | Mass spectrometer system and method using simultaneous mode detector and signal region flags | Peter Buckley, Todd Daynes, Val Gretxhev, Drake Hirasawa, Graham A. LEITH | 1995-10-31 |
| 5381008 | Method of plasma mass analysis with reduced space charge effects | Scott D. Tanner, Donald J. Douglas | 1995-01-10 |