Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5018863 | Apparatus for analysis by ellipsometry, procedure for ellipsometric analysis of a sample and application to the measurement of variations in the thickness of thin films | Aime Vareille, Louis Thevenot | 1991-05-28 |