David R. Riese

AT AT&T: 1 patents #10,626 of 18,772Top 60%

📍 Bradford, MA: #41 of 76 inventorsTop 55%

🗺 Massachusetts: #56,664 of 88,656 inventorsTop 65%

Overall (All Time): #3,865,745 of 4,157,543Top 95%

Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
5172420	Method for monitoring the dimensions and other aspects linewidth thickness and discoloration of specular patterns	Rajarshi Ray	1992-12-15