Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7307430 | Open offset canceling method and an impedance measuring apparatus using the method | Koji Tokuno, Hideki Wakamatsu | 2007-12-11 |
| 5014012 | D.C. biasing apparatus | Koichi Yanagawa | 1991-05-07 |
| 4885528 | Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test | Hideshi Tanaka, Kazuyuki Yagi, Shigeru Tanimoto, Yasuaki Komatsu, Koichi Yanagawa | 1989-12-05 |