Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11473126 | Method for analyzing melting curve using bi-functional PNA probe, method for diagnosing microsatellite instability using the same, and kit for diagnosing microsatellite instability | Han Woo Lee, Deokhwe Hur, Hee Kyung Park | 2022-10-18 |