Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5372645 | Method for determining thickness of chemical vapor deposited layers | James F. Fleischer, David Woodruff | 1994-12-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5372645 | Method for determining thickness of chemical vapor deposited layers | James F. Fleischer, David Woodruff | 1994-12-13 |