Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10255671 | System and method for capture of high resolution/high magnification images | Matthew Zmijewski, Eric Eisack, Robert Paul Luoma, II | 2019-04-09 |
| 7117047 | High accuracy inspection system and method for using same | Buddy Ehrlich, Eric Eisack, Robert Paul Luoma, II | 2006-10-03 |
| 6304680 | High resolution, high accuracy process monitoring system | Frederick S. Fenning, Lucille M. Kayes, Ilya Lapshin | 2001-10-16 |