Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066448 | Specimen inspection automation system and specimen inspection method | Shigeru Yano, Misato Fukami, Ai Masuda | 2024-08-20 |
| 11567094 | Specimen inspection automation system and method for managing empty specimen carrier | Takeshi Matsuka | 2023-01-31 |