Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165931 | Method and device for measuring semiconductor multilayer structure based on second harmonic | Chongji Huang, Weiwei Zhao | 2024-12-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165931 | Method and device for measuring semiconductor multilayer structure based on second harmonic | Chongji Huang, Weiwei Zhao | 2024-12-10 |