Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002426 | Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | Gerald W. Back | 1999-12-14 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6002426 | Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits | Gerald W. Back | 1999-12-14 |