Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6538459 | Automatic calibration system for apparatus for measuring variations in thickness of elongated samples of thin plastic film | — | 2003-03-25 |
| 6201399 | Automatic calibration system for apparatus for measuring variations in thickness of eleongated samples of thin plastic film | Kevin D. Edmunds | 2001-03-13 |
| 5966018 | Apparatus for measuring variations in thickness of elongated samples of thin plastic film | Kevin D. Edmunds | 1999-10-12 |