Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11671185 | Main measurement device, secondary measurement device, measurement system and method | Andreas Ziegler, Detlef Schlager, Jens Naumann, Sebastian Petzsch, Thomas Kuhwald +1 more | 2023-06-06 |
| 6487473 | Method and apparatus for real time yield control | William Scott Beck, Alan L. Mountain | 2002-11-26 |